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20222026
most citedComphy v3.0 -- A Compact-Physics Framework for Modeling Charge Trapping Related Reliability Phenomena in MOS Devices

36 citations · 48 across the 10 of their papers we have counts for

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Showing 2025Show all

5 papers · 1 filter

cond-mat.mtrl-sci2025

Towards ultra-scaled nanoelectronics using the zipper material system

Mohammad Rasool Davoudi, Mina Bahrami, Axel Verdianu +20

Two-dimensional (2D) materials could overcome the scaling bottleneck of nanoelectronics by enabling atomically thin channels, superior electrostatic control, and reduced short-chan…

cond-mat.mtrl-sci2025

Valley Splittings in Si/SiGe Heterostructures from First Principles

Lukas Cvitkovich, Tancredi Salamone, Christoph Wilhelmer +3

We compute valley splittings in Si/SiGe superlattices using ab initio density functional theory (DFT). This first-principle approach is expected to provide an excellent description…

physics.app-ph2025

Hysteresis Measurements as a Diagnostic Tool: A Systematic Approach for Stability Benchmarking and Performance Projection of 2D-Materials-Based MOSFETs

Alexander Karl, Dominic Waldhoer, Theresia Knobloch +19

Judging by its omnipresence in the literature, the hysteresis observed in the transfer characteristics of emerging transistors based on 2D-materials is widely accepted as an import…

physics.app-ph2025

How to Identify Suitable Gate Dielectrics for Transistors based on Two-Dimensional Semiconductors

Theresia Knobloch, Quentin Smets, Anton E. O. Persson +23

The recent progress in nanosheet transistors has established two-dimensional (2D) semiconductors as viable candidates for future ultra-scaled electronic devices. Next to reducing c…

cond-mat.mes-hall2025★ 1 cited

Device-scaling constraints imposed by the van der Waals gap formed in two-dimensional materials

Mahdi Pourfath, Tibor Grasser

Transistor miniaturization requires controlling gate leakage through ultrathin dielectrics and minimizing source/drain contact resistance. Although two-dimensional (2D) semiconduct…