8 papers
HOLMES: In-Context Failure-Center Localization for High-Dimensional Yield Estimation
Wei W. Xing, Xixi Zhou, Kaiqi Huang +4
Importance sampling for high-sigma yield estimation requires locating the failure center from a severely imbalanced sample set. Existing surrogate-assisted methods rely on iterativ…
OpenOpt: An Open-Source SRAM Optimizer Based on Equivalent Circuit Model
Yikai Wang, Yiheng Wu, Can Wang +5
This paper proposes a co-optimization framework that jointly optimizes SRAM architecture and transistor sizing using equivalent circuit models. The framework simplifies inactive SR…
Accuracy-Configurable Floating-Point Multiplier Design for SRAM-Based Compute-in-Memory
Yiqi Zhou, Junhao Lu, Jiale Yu +5
Digital Compute-in-Memory (DCiM) reduces data movement and has become a promising solution for energy-efficient edge AI. However, most existing DCiM frameworks still primarily targ…
R2G: A Multi-View Circuit Graph Benchmark Suite from RTL to GDSII
Zewei Zhou, Jiajun Zou, Jiajia Zhang +8
Graph neural networks (GNNs) are increasingly applied to physical design tasks such as congestion prediction and wirelength estimation, yet progress is hindered by inconsistent cir…
Breaking the Tuning Barrier: Zero-Hyperparameters Yield Multi-Corner Analysis Via Learned Priors
Wei W. Xing, Kaiqi Huang, Jiazhan Liu +2
Yield Multi-Corner Analysis validates circuits across 25+ Process-Voltage-Temperature corners, resulting in a combinatorial simulation cost of where denotes cor…
OpenACMv2: An Accuracy-Constrained Co-Optimization Framework for Approximate DCiM
Yiqi Zhou, Yue Yuan, Yikai Wang +8
Digital Compute-in-Memory (DCiM) accelerates neural networks by reducing data movement. Approximate DCiM can further improve power-performance-area (PPA), but demands accuracy-cons…
OpenACM: An Open-Source SRAM-Based Approximate CiM Compiler
Yiqi Zhou, JunHao Ma, Xingyang Li +10
The rise of data-intensive AI workloads has exacerbated the ``memory wall'' bottleneck. Digital Compute-in-Memory (DCiM) using SRAM offers a scalable solution, but its vast design…
OpenYield: An Open-Source SRAM Yield Analysis and Optimization Benchmark Suite
Shan Shen, Xingyang Li, Zhuohua Liu +5
Static Random-Access Memory (SRAM) yield analysis is essential for semiconductor innovation, yet research progress faces a critical challenge: the large gap between simplified acad…