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researcher

Xiaolei Wang

5 papers hereh-index 10347 citations104 works total

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • middle author4
  • last author1

Across the 5 of 5 papers where every author was matched, so the position is known.

fields
  • cond-mat.mtrl-sci3
  • physics.app-ph2
same name
  • Xiaolei Wang — 15 papers, h 10
  • Xiaolei Wang — 3 papers, h 9
  • Xiaolei Wang — 3 papers, h 5
  • Xiaolei Wang — 3 papers, h 2
  • Xiaolei Wang — 2 papers, h 3
  • Xiaolei Wang — 2 papers, h 2

Either other researchers who publish under this name, or the same person where the external sources have not merged their records.

identity via Semantic Scholar / OpenAlex

activity
20232026
most citedEnlargement of Memory Window of Si Channel FeFET by Inserting Al2O3 Interlayer on Ferroelectric Hf0.5Zr0.5O2

1 citations · 1 across the 4 of their papers we have counts for

collaborators
Showing cond-mat.mtrl-sciShow all

3 papers · 1 filter

cond-mat.mtrl-sci2026

Si/SiGe multi-channel superlattice structure epitaxial growth with segmented temperature control for Next-Generation Logic Devices

Wenlong Yao, Zhigang Li, Guobin Bai +5

Stacking multiple SiSiGe channels in advanced logic devices faces severe thermal budget accumulation, which degrades interfaces via Ge-Si interdiffusion and strain relaxation.This…

cond-mat.mtrl-sci2024

Impact of the Top SiO2 Interlayer Thickness on Memory Window of Si Channel FeFET with TiN/SiO2/Hf0.5Zr0.5O2/SiOx/Si (MIFIS) Gate Structure

Tao Hu, Xianzhou Shao, Mingkai Bai +13

We study the impact of top SiO2 interlayer thickness on the memory window (MW) of Si channel ferroelectric field-effect transistor (FeFET) with TiN/SiO2/Hf0.5Zr0.5O2/SiOx/Si (MIFIS…

cond-mat.mtrl-sci2023★ 1 cited

Enlargement of Memory Window of Si Channel FeFET by Inserting Al2O3 Interlayer on Ferroelectric Hf0.5Zr0.5O2

Tao Hu, Xiaoqing Sun, Mingkai Bai +12

In this work, we demonstrate the enlargement of the memory window of Si channel FeFET with ferroelectric Hf0.5Zr0.5O2 by gate-side dielectric interlayer engineering. By inserting a…

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