77 citations · 380 across the 15 of their papers we have counts for
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Advanced data analysis procedure for hard x-ray resonant magnetic reflectivity discussed for Pt thin film samples of various complexity
Jan Krieft, Dominik Graulich, Anastasiia Moskaltsova +3
X-ray resonant magnetic reflectivity (XRMR) is a powerful method to determine the optical, structural and magnetic depth profiles of a variety of thin films. Here, we investigate s…
Thickness-dependence of the Dzyaloshinskii-Moriya interaction in Co2FeAl ultrathin films: effects of the annealing temperature and the heavy metal material
M. Belmeguenai, Y. Roussigné, S. M. Chérif +8
Interfacial Dzyaloshinskii-Moriya interaction (iDMI) has been investigated in Co2FeAl (CFA) ultrathin films of various thicknesses (0.8 nm<tCFA<2 nm) grown on Si substrates, using…
Quantitative disentanglement of spin Seebeck, proximity-induced and intrinsic anomalous Nernst effect in NM/FM bilayers
Panagiota Bougiatioti, Christoph Klewe, Daniel Meier +8
We identify and investigate thermal spin transport phenomena in sputter-deposited Pt/NiFeO () bilayers. We separate the voltage generated by th…
A study of uranium-based multilayers: II. Magnetic properties
R Springell, S W Zochowski, R C C Ward +7
SQUID magnetometry and polarised neutron reflectivity measurements have been employed to characterise the magnetic properties of U/Fe, U/Co and U/Gd multilayers. The field dependen…
A study of uranium-based multilayers: I. Fabrication and structural characterisation
R Springell, S W Zochowski, R C C Ward +7
This paper addresses the structural characterisation of a series of U/Fe, U/Co and U/Gd multilayers. X-ray reflectivity has been employed to investigate the layer thickness and rou…