Advanced data analysis procedure for hard x-ray resonant magnetic reflectivity discussed for Pt thin film samples of various complexity

Abstract

X-ray resonant magnetic reflectivity (XRMR) is a powerful method to determine the optical, structural and magnetic depth profiles of a variety of thin films. Here, we investigate samples of different complexity all measured at the Pt L${}_3$ absorption edge to determine the optimal procedure for the analysis of the experimental XRMR curves, especially for nontrivial bi- and multilayer samples that include differently bonded Pt from layer to layer. The software tool ReMagX is used to fit these data and model the magnetooptic depth profiles based on a highly adaptable layer stack which is modified to be a more precise and physically consistent representation of the real multilayer system. Various fitting algorithms, iterative optimization approaches and a detailed analysis of the asymmetry ratio features as well as ${\chi }^2$ (goodness of fit) landscapes are utilized to improve the agreement between measurements and simulations. We present a step-by-step analysis procedure tailored to the Pt thin film systems to take advantage of the excellent magnetic sensitivity and depth resolution of XRMR.

16 pages, 14 figures

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Cited by in corpus (5)

• Disclosing the nature of asymmetric interface magnetism in Co/Pt multilayers
• Static magnetic proximity effects and spin Hall magnetoresistance in Pt/Y${}_3$Fe${}_5$O${}_{12}$ and inverted Y${}_3$Fe${}_5$O${}_{12}$/Pt bilayers
• Cation- and lattice-site-selective magnetic depth profiles of ultrathin $\mathrm{F}{\mathrm{e}}_3{\mathrm{O}}_4$(001) films
• Quantitative comparison of the magnetic proximity effect in Pt detected by XRMR and XMCD
• Structural and magnetic investigation of the interfaces of $\mathrm{F}{\mathrm{e}}_3{\mathrm{O}}_4/MgO(001)$ with and without NiO interlayer