81 citations · 236 across the 12 of their papers we have counts for
12 papers
The strain-induced transitions of the piezoelectric, pyroelectric and electrocaloric properties of the CuInPS films
Anna N. Morozovska, Eugene A. Eliseev, Lesya P. Yurchenko +5
The low-dimensional ferroelectrics, ferrielectrics and antiferroelectrics are of urgent scientific interest due to their unusual polar, piezoelectric, electrocaloric and pyroelectr…
Bending-induced isostructural transitions in ultrathin layers of van der Waals ferrielectrics
Anna N. Morozovska, Eugene A. Eliseev, Yongtao Liu +8
Using Landau-Ginzburg-Devonshire (LGD) phenomenological approach we analyze the bending-induced re-distribution of electric polarization and field, elastic stresses and strains ins…
A Combined Theoretical and Experimental Study of the Phase Coexistence and Morphotropic Boundaries in Ferroelectric-Antiferroelectric-Antiferrodistortive Multiferroics
Anna N. Morozovska, Dmitry V. Karpinsky, Denis O. Alikin +12
The physical nature of the ferroelectric (FE), ferrielectric (FEI) and antiferroelectric (AFE) phases, their coexistence and spatial distributions underpin the functionality of ant…
Nanoscale ferroelectricity in pseudo-cubic sol-gel derived barium titanate -- bismuth ferrite (BaTiO-BiFeO) solid solutions
A. Pakalniskis A. Lukowiak, G. Niaura, P. Gluchowski +9
Single phase barium titanate-bismuth ferrite ((1-x)BaTi-(x)BiFe, BTO-BFO) solid solutions were prepared using citric acid and ethylene glycol assisted sol-gel synthesis met…
Ferroelectricity in epitaxially strained rhombohedral ZrO2 thin films
J. P. B. Silva, R. F. Negrea, M. C. Istrate +7
Zirconia and hafnia based thin films have attracted tremendous attention in the last decade due to their unexpected ferroelectric behavior at the nanoscale, which facilitates the d…
Local electronic transport across probe/ionic conductor interface in scanning probe microscopy
K. N. Romanuk, D. O. Alikin, B. N. Slautin +3
Charge carrier transport through the probe-sample junction can have substantial consequences for outcomes of electrical and electromechanical atomic-force-microscopy (AFM) measurem…