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20072020
most citedVacancy defects induced changes in the electronic and optical properties of NiO studied by spectroscopic ellipsometry and first-principles calculations

102 citations · 132 across the 5 of their papers we have counts for

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Showing 2014Show all

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cond-mat.mtrl-sci2014★ 9 cited

Composition determination of quaternary GaAsPN layers from single XRD measurement of quasi-forbidden (002) reflection

J. -M. Tilli, H. Jussila, K. M. Yu +2

GaAsPN layers with a thickness of 30nm were grown on GaP substrates with metalorganic vapor phase epitaxy to study the feasibility of a single X-ray diffraction (XRD) measurement f…