124 citations · 258 across the 8 of their papers we have counts for
6 papers · 1 filter
Oxidation effects on graded porous silicon anti-reflection coatings
Annett Thøgersen, Josefine H. Selj, Erik S. Marstein
Efficient anti-reflection coatings (ARC) improve the light collection and thereby increase the current output of solar cells. By simple electrochemical etching of the Si wafer, por…
Elemental distribution and oxygen deficiency of magnetron sputtered ITO films
Annett Thøgersen, Margrethe Rein, Edouard Monakhov +2
The atomic structure and composition of non-interfacial ITO and ITO-Si interfaces were studied with Transmission Electron Microscopy (TEM) and X-ray Photoelectron Spectroscopy (XPS…
Composition and structure of Pd nanoclusters in SiO thin film
Annett Thøgersen, Jeyanthinath Mayandi, Lasse Vines +5
The nucleation, distribution, composition and structure of Pd nanocrystals in SiO multilayers containing Ge, Si, and Pd are studied using High Resolution Transmission Electron…
The formation of Er-oxide nanoclusters in SiO thin films with excess Si
Annett Thøgersen, Jeyanthinath Mayandi, Terje Finstad +4
The nucleation, distribution and composition of erbium embedded in a SiO-Si layer were studied with High Resolution Transmission Electron Microscopy (HRTEM), Electron Energy Lo…
Characterization of amorphous and crystalline silicon nanoclusters in ultra thin silica layers
Annett Thøgersen, Jeyanthinath Mayandi, Terje G. Finstad +4
The nucleation and structure of silicon nanocrystals formed by different preparation conditions and silicon concentration (28 - 70 area %) have been studied using Transmission Elec…
An experimental study of charge distribution in crystalline and amorphous Si nanoclusters in thin silica films
Annett Thøgersen, Spyros Diplas, Jeyanthinath Mayandi +5
Crystalline and amorphous nanoparticles of silicon in thin silica layers were examined by transmission electron microscopy (TEM), electron energy loss spectroscopy (EELS) and x-ray…