activity
20072025
most citedOxidation effects on graded porous silicon anti-reflection coatings

124 citations · 281 across the 10 of their papers we have counts for

collaborators

11 papers

cond-mat.mtrl-sci2025

Decoupling Composition and Band Gap in -GaO Heterostructures via STEM-EELS

Annett Thøgersen, Georg Muntingh, Lasse Vines +5

High-resolution mapping of electronic properties at oxide heterointerfaces remains challenging due to probe delocalization and overlapping signals. In this work, we employ monochro…

cond-mat.mtrl-sci2013★ 2 cited

Solar induced growth of silver nanocrystals

Annett Thøgersen, Georg Muntingh

The effect of solar irradiation on plasmonic silver nanocrystals has been investigated using Transmission Electron Microscopy and size distribution analysis, in the context of sola…

cond-mat.mtrl-sci2012★ 124 cited

Oxidation effects on graded porous silicon anti-reflection coatings

Annett Thøgersen, Josefine H. Selj, Erik S. Marstein

Efficient anti-reflection coatings (ARC) improve the light collection and thereby increase the current output of solar cells. By simple electrochemical etching of the Si wafer, por…

cond-mat.mtrl-sci2012★ 57 cited

Elemental distribution and oxygen deficiency of magnetron sputtered ITO films

Annett Thøgersen, Margrethe Rein, Edouard Monakhov +2

The atomic structure and composition of non-interfacial ITO and ITO-Si interfaces were studied with Transmission Electron Microscopy (TEM) and X-ray Photoelectron Spectroscopy (XPS…

cond-mat.mtrl-sci2012★ 24 cited

Composition and structure of Pd nanoclusters in SiO thin film

Annett Thøgersen, Jeyanthinath Mayandi, Lasse Vines +5

The nucleation, distribution, composition and structure of Pd nanocrystals in SiO multilayers containing Ge, Si, and Pd are studied using High Resolution Transmission Electron…

cond-mat.mtrl-sci2012★ 8 cited

The formation of Er-oxide nanoclusters in SiO thin films with excess Si

Annett Thøgersen, Jeyanthinath Mayandi, Terje Finstad +4

The nucleation, distribution and composition of erbium embedded in a SiO-Si layer were studied with High Resolution Transmission Electron Microscopy (HRTEM), Electron Energy Lo…