Ti-rich and Cu-poor grain-boundary layers of CaCu${}_3$Ti${}_4$O${}_{12}$ detected by x-ray photoelectron spectroscopy

C. Wang, H. J. Zhang, P. M. He +1

Cleaved and polished surfaces of CaCu${}_3$Ti${}_4$O${}_{12}$ ceramics have been investigated by x-ray photoelectron spectroscopy (XPS) and energy dispersive x-ray spectroscopy (EDX), re…