Ti-rich and Cu-poor grain-boundary layers of CaCu$_3$Ti$_4$O$_{12}$ detected by x-ray photoelectron spectroscopy

C. Wang; H. J. Zhang; P. M. He; G. H. Cao

doi:10.1063/1.2768006

paper

Ti-rich and Cu-poor grain-boundary layers of CaCu $_{3}$ Ti $_{4}$ O $_{12}$ detected by x-ray photoelectron spectroscopy

arXiv:0708.2301 · doi:10.1063/1.2768006

Abstract

Cleaved and polished surfaces of CaCu $_{3}$ Ti $_{4}$ O $_{12}$ ceramics have been investigated by x-ray photoelectron spectroscopy (XPS) and energy dispersive x-ray spectroscopy (EDX), respectively. While EDX technique shows the identical CaCu $_{3}$ Ti $_{4}$ O $_{12}$ stoichiometry for the two surfaces, XPS indicates that the cleaved surface with grain-boundary layers is remarkably Ti-rich and Cu-poor. The core-level spectrum of Cu 2 $p$ unambiguously shows the existence of monovalent copper only for the cleaved surface. Possible grain-boundary structure and its formation are discussed.

8 pages, 3 figures

Ti-rich and Cu-poor grain-boundary layers of CaCu3​Ti4​O12​ detected by x-ray photoelectron spectroscopy

Abstract

Ti-rich and Cu-poor grain-boundary layers of CaCu $_{3}$ Ti $_{4}$ O $_{12}$ detected by x-ray photoelectron spectroscopy