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most citedQuantum oscillations in two coupled charge qubits

717 citations · 4.5k across the 70 of their papers we have counts for

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10 papers · 1 filter

cond-mat.supr-con2010★ 37 cited

Quantum behaviour of a flux qubit coupled to a resonator

A. N. Omelyanchouk, S. N. Shevchenko, Ya. S. Greenberg +2

We present a detailed theoretical analysis for a system of a superconducting flux qubit coupled to a transmission line resonator. The master equation, accounting incoherent process…

cond-mat.supr-con2010★ 14 cited

Charge transport through ultrasmall single and double Josephson junctions coupled to resonant modes of the electromagnetic environment

Yu. A. Pashkin, H. Im, J. Leppäkangas +5

We have investigated charge transport in ultrasmall superconducting single and double Josephson junctions coupled to resonant modes of the electromagnetic environment. We observe p…

cond-mat.mtrl-sci2010

On the nature of large-scale defect accumulations in Czochralski-grown silicon

V. P. Kalinushkin, A. N. Buzynin, V. A. Yuryev +2

Czochralski-grown boron-doped silicon crystals were studied by the techniques of the low-angle mid-IR-light scattering and electron-beam-induced current. The large-scale accumulati…

cond-mat.mtrl-sci2010

Possibilities of application of elastic mid-IR light scattering for inspection of internal gettering operations

O. V. Astafiev, A. N. Buzynin, V. P. Kalinushkin +2

A method of low-angle mid-IR light scattering is shown to be applicable for the contactless and non-destructive inspection of the internal gettering process in CZ Si crystals. A cl…

cond-mat.mtrl-sci2010★ 1 cited

Scanning mid-IR-laser microscopy: an efficient tool for materials studies in silicon-based photonics and photovoltaics

O. V. Astafiev, V. P. Kalinushkin, V. A. Yuryev

A method of scanning mid-IR-laser microscopy has recently been proposed for the investigation of large-scale electrically and recombination-active defects in semiconductors and non…

cond-mat.mtrl-sci2010★ 1 cited

Application of scanning mid-IR-laser microscopy for characterization of semiconductor materials for photovoltaics

V. P. Kalinushkin, O. V. Astafiev, V. A. Yuryev

The scanning mid-IR-laser microscopy was previously demonstrated as an effective tool for characterization of different semiconductor crystals. Now the technique has been successfu…