106 citations · 445 across the 17 of their papers we have counts for
17 papers
Determination of optimal experimental conditions for accurate 3D reconstruction of the magnetization vector via XMCD-PEEM
Miguel A. Cascales Sandoval, A. Hierro-Rodríguez, S. Ruiz-Gómez +10
In this work we present a detailed analysis on the performance of X-ray magnetic circular dichroism photo-emission electron microscopy (XMCD-PEEM) as a tool for vector reconstructi…
Soft X-ray spectro-ptychography on boron nitride nanotubes, carbon nanotubes and permalloy nanorods
Jaianth Vijayakumar, Hao Yuan, Nicolas Mille +6
Spectro-ptychography offers improved spatial resolution and additional phase spectral information relative to that provided by scanning transmission X-ray microscopes (STXM). Howev…
Micromagnetics of magnetic chemical modulations in soft-magnetic cylindrical nanowires
L. Álvaro-Gómez, S. Ruiz-Gómez, C. Fernández-González +17
We analyze the micromagnetics of short longitudinal modulations of a high-magnetization material in cylindrical nanowires made of a soft-magnetic material of lower magnetization su…
Skyrmions in synthetic antiferromagnets and their nucleation via electrical current and ultrafast laser illumination
Roméo Juge, Naveen Sisodia, Joseba Urrestarazu Larrañaga +24
Magnetic skyrmions are topological spin textures that hold great promise as nanoscale information carriers in non-volatile memory and logic devices. While room-temperature magnetic…
Domain wall automotion in three-dimensional magnetic helical interconnectors
L. Skoric, C. Donnelly, A. Hierro-Rodriguez +7
The fundamental limits currently faced by traditional computing devices necessitate the exploration of new ways to store, compute and transmit information. Here, we propose a three…
Exploiting atomic layer deposition for fabricating sub-10 nm X-ray lenses
Benedikt Rösner, Frieder Koch, Florian Döring +12
Moving towards significantly smaller nanostructures, direct structuring techniques such as electron beam lithography approach fundamental limitations in feature size and aspect rat…