Origin and tailoring of the antiferromagnetic domain structure in $\alpha$-Fe${}_2$O${}_3$ thin films unraveled by statistical analysis of dichroic spectro-microscopy (X-PEEM) images

Abstract

The magnetic microstructure and domain wall distribution of antiferromagnetic $\alpha$-Fe${}_2$O${}_3$ epitaxial layers is determined by statistical image analyses. Using dichroic spectro-microscopy images, we demonstrate that the domain structure is statistically invariant with thickness and that the antiferromagnetic domain structure of the thin films is inherited from the ferrimagnetic precursor layer one, even after complete transformation into antiferromagnetic $\alpha$-Fe${}_2$O${}_3$. We show that modifying the magnetic domain structure of the precursor layer is a genuine way to tune the magnetic domain structure and domain walls of the antiferromagnetic layers.

References in corpus (4)

• Fractal dimension and size scaling of domains in thin films of multiferroic BiFeO3
• Direct measurement of antiferromagnetic domain fluctuations
• Effect of Polarized Current on the Magnetic State of Antiferromagnet
• Exact Ground State Properties of Disordered Ising-Systems

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