most citedCreating temperature dependent Ni-MH battery models for low power mobile devices

10 citations · 30 across the 10 of their papers we have counts for

collaborators
Showing physics.gen-phShow all

2 papers · 1 filter

physics.gen-ph2008

Vibration Combined High Temperature Cycle Tests for Capacitive MEMS Accelerometers

Z. Szucs, G. Nagy, S. Hodossy +2

In this paper vibration combined high temperature cycle tests for packaged capacitive SOI-MEMS accelerometers are presented. The aim of these tests is to provide useful Design for…

physics.gen-ph2008

Short time die attach characterisation of semiconductor devices

P. Szabo, M. Rencz

Thermal qualification of the die attach of semiconductor devices is a very important element in the device characterization as the temperature of the chip is strongly affected by t…