211 citations · 930 across the 29 of their papers we have counts for
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In situ monitoring of atomic layer epitaxy via optical ellipsometry
Fryderyk Lyzwa, Premysl Marsik, Vladimir Roddatis +3
We report on the use of time-resolved optical ellipsometry to monitor the deposition of single atomic layers with subatomic sensitivity. Ruddlesden-Popper thin films of SrO(SrTiO3)…
Superconductivity and charge carrier localization in ultrathin bilayers
K. Sen, P. Marsik, S. Das +6
/ (LSCO15/LCO) bilayers with a precisely controlled thickness of N unit cells (UCs) of the former and M UCs of the latter ([LS…
Infrared ellipsometry study of the photo-generated charge carriers at the (001) and (110) surfaces of SrTiO crystals and the interface of corresponding LaAlO/SrTiO heterostructures
M. Yazdi-Rizi, P. Marsik, B. P. P. Mallett +7
With infrared (IR) ellipsometry and DC resistance measurements we investigated the photo-doping at the (001) and (110) surfaces of SrTiO (STO) single crystals and at the corres…
Local Terahertz Field Enhancement for Time-Resolved X-ray Diffraction
Michael Kozina, Matteo Pancaldi, Christian Bernhard +9
We report local field strength enhancement of single-cycle terahertz (THz) pulses in an ultrafast time-resolved x-ray diffraction experiment. We show that patterning the sample wit…