activity
20082020
most citedUltrathin perpendicular free layers for lowering the switching current in STT-MRAM

22 citations · 84 across the 7 of their papers we have counts for

collaborators

7 papers

cond-mat.mtrl-sci2020★ 22 cited

Ultrathin perpendicular free layers for lowering the switching current in STT-MRAM

Tiffany S. Santos, Goran Mihajlovic, Neil Smith +4

The critical current density required for switching the magnetization of the free layer (FL) in a spin-transfer torque magnetic random access memory (STT-MRAM) cell is pro…

cond-mat.mes-hall2020★ 20 cited

Thermal stability for domain wall mediated magnetization reversal in perpendicular STT MRAM cells with W insertion layers

G. Mihajlovic, N. Smith, T. Santos +3

We present an analytical model for calculating energy barrier for the magnetic field-driven domain wall-mediated magnetization reversal of a magneto-resistive random access memory…

cond-mat.mes-hall2019

Origin of the resistance-area product dependence of spin transfer torque switching in perpendicular magnetic random access memory cells

Goran Mihajlovic, Neil Smith, Tiffany Santos +5

We report on an experimental study of current induced switching in perpendicular magnetic random access memory (MRAM) cells with variable resistance-area products (RAs). Our result…

cond-mat.mtrl-sci2016★ 8 cited

Template-Assisted Direct Growth of 1Td/in Bit Patterned Media

En Yang, Zuwei Liu, Hitesh Arora +8

We present a method for growing bit patterned magnetic recording media using directed growth of sputtered granular perpendicular magnetic recording media. The grain nucleation is t…

cond-mat.mes-hall2008★ 16 cited

Electrical Switching Dynamics in Circular and Rectangular Ge2Sb2Te5 Nanopillar Phase Change Memory Devices

Ozhan Ozatay, Barry Stipe, Jordan Katine +1

We have measured the critical phase change conditions induced by electrical pulses in Ge2Sb2Te5 nanopillar phase change memory devices by constructing a comprehensive resistance ma…

cond-mat.mes-hall2008

Scaling Properties of Critical Phase Change Conditions in Ge2Sb2Te5 Nanopillars

O. Ozatay, B. Stipe, J. A. Katine +1

We have measured the critical phase change conditions induced by electrical pulses in Ge2Sb2Te5 nanopillar phase change memory devices by constructing a comprehensive resistance ma…