3 citations · 5 across the 11 of their papers we have counts for
11 papers
On Transmission Function Amplitude and Phase Recovery in Multislice Electron Ptychography
Bridget R. Denzer, Colin Gilgenbach, James M. LeBeau
{Multislice electron ptychography commonly accounts for inelastic scattering by including an absorptive object potential in the reconstruction forward model that attenuates the ela…
Direct determination of antiferroelectric-to-ferroelectric phase transition pathways in PbZrO with Operando Electron Microscopy
Menglin Zhu, Michael Xu, Louis Alaerts +5
Under a sufficiently high applied electric field, a non-polar antiferroelectric material, such as \ce{PbZrO3}, can undergo a rapid transformation to a polar ferroelectric phase. Wh…
Operando Electron Microscopy of Nanoscale Electronic Devices on Non-Conductive Substrates
Menglin Zhu, Michael Xu, Zishen Tian +7
Achieving operating conditions comparable to ``bulk'' electronic devices, such as thin film capacitors, during \textit{operando} electron microscopy remains challenging, particular…
Optimizing Atomic Number Contrast in Multislice Electron Ptychography
Bridget R. Denzer, Colin Gilgenbach, James M. LeBeau
Here we explore the atomic number () dependence of multislice electron ptychography and approaches to optimize Z sensitivity. Specifically, we show that ptychography's -depen…
phaser: A unified and extensible framework for fast electron ptychography
Colin Gilgenbach, Menglin Zhu, James M. LeBeau
We present \code{phaser}, an open-source Python package that provides a unified interface to both conventional and gradient descent-based ptychographic algorithms. Features such as…
Grain Boundary Space Charge Engineering of Solid Oxide Electrolytes: Model Thin Film Study
Thomas Defferriere, Yong Beom Kim, Colin Gilgenbach +3
Grain boundaries (GB) profoundly influence the electrical properties of polycrystalline ionic solids. Yet, precise control of their transport characteristics has remained elusive,…
Sensitivity of Multislice Electron Ptychography to Point Defects: A Case Study in SiC
Aaditya Bhat, Colin Gilgenbach, Junghwa Kim +3
Here, we evaluate multislice electron ptychography as a tool to carry out depth-resolved atomic resolution characterization of point defects, using silicon carbide as a case study.…
Quantifying Implantation Induced Damage and Point Defects with Multislice Electron Ptychography
Junghwa Kim, Colin Gilgenbach, Aaditya Bhat +1
Here, we use multislice electron ptychography to quantify damage introduced by ion implantation of Er into 4H-SiC. Comparing reconstructed volumes from experiment (each 2,000 nm$^{…
Bridging experiment and theory of relaxor ferroelectrics at the atomic scale with multislice electron ptychography
Menglin Zhu, Michael Xu, Yubo Qi +7
Introducing structural and/or chemical heterogeneity into otherwise ordered crystals can dramatically alter material properties. Lead-based relaxor ferroelectrics are a prototypica…
Insights into Chemical and Structural Order at Planar Defects in a Functional Oxide Using Multislice Electron Ptychography
Menglin Zhu, Michael Xu, Yu Yun +7
Switchable order parameters in ferroic materials are essential for functional electronic devices, yet disruptions of the ordering can take the form of planar boundaries or defects…
Sampling metrics for robust reconstructions in multislice ptychography: Theory and experiment
Colin Gilgenbach, Xi Chen, James M. LeBeau
While multislice electron ptychography can provide thermal-vibration limited resolution and 3D information, it relies on the proper selection of many intertwined experimental and c…