activity
20082026
most citedUltrathin AlScN for low-voltage driven ferroelectric-based devices

54 citations · 106 across the 5 of their papers we have counts for

collaborators

6 papers

cond-mat.mtrl-sci2026

Beyond the Parasitic Limit: A Nanoprobing Framework for De-embedding Intrinsic Ferroelectric Properties at the Deep Sub-Micrometer Scale

Niklas Kyoushi, Georg Schönweger, Ole Gronenberg +4

The continued scaling of ferroelectric devices is critical for next-generation computing architectures, yet it is fundamentally challenged by a metrological bottleneck: at the deep…

cond-mat.mtrl-sci2023★ 2 cited

In-Grain Ferroelectric Switching in Sub-5 nm Thin AlScN Films at 1 V

Georg Schönweger, Niklas Wolff, Md Redwanul Islam +5

Analog switching in ferroelectric devices promises neuromorphic computing with highest energy efficiency, if limited device scalability can be overcome. To contribute to a solution…

physics.app-ph2022★ 54 cited

Ultrathin AlScN for low-voltage driven ferroelectric-based devices

Georg Schönweger, Md Redwanul Islam, Niklas Wolff +4

Thickness scaling of ferroelectricity in AlScN is a determining factor for its potential application in neuromorphic computing and memory devices. In this letter, we report on ultr…

cond-mat.mtrl-sci2020

Ferroelectricity in AlScN: Switching, Imprint and sub-150 nm Films

Simon Fichtner, Georg Schönweger, Tom-Niklas Kreutzer +4

The discovery of ferroelectricity in AlScN allowed the first clear observation of the effect in the wurtzite crystal structure, resulting in a material with a previously unpreceden…

cond-mat.mtrl-sci2018★ 50 cited

Full field electron spectromicroscopy applied to ferroelectric materials

N. Barrett, J. E. Rault, J. L. Wang +15

The application of PhotoEmission Electron Microscopy (PEEM) and Low Energy Electron Microscopy (LEEM) techniques to the study of the electronic and chemical structure of ferroelect…

cond-mat.mtrl-sci2008

Polarization dependent interface properties of ferroelectric Schottky barriers studied by soft X-ray absorption spectroscopy

H. Kohlstedt, A. Petraru, M. Meier J. Denlinger +11

We applied soft X-ray absorption spectroscopy to study the Ti L-edge in ferroelectric capacitors using a modified total electron yield method. The inner photo currents and the X-ra…