5 citations · 8 across the 5 of their papers we have counts for
5 papers
AI-Augmented Photon-Trapping Spectrometer-on-a-Chip on Silicon Platform with Extended Near-Infrared Sensitivity
Ahasan Ahamed, Htet Myat, Amita Rawat +2
We present a compact, noise-resilient reconstructive spectrometer-on-a-chip that achieves high-resolution hyperspectral imaging across an extended near-infrared (NIR) range up to 1…
Achieving higher photoabsorption than group III-V semiconductors in silicon using photon-trapping surface structures
Wayesh Qarony, Ahmed S. Mayet, Ekaterina Ponizovskaya Devine +8
The photosensitivity of silicon is inherently very low in the visible electromagnetic spectrum, and it drops rapidly beyond 800 nm in near-infrared wavelengths. Herein, we have exp…
CMOS image sensor with micro-nano holes to improve NIR optical efficiency: micro-holes on top surface vs on bottom
E. Ponizovskaya Devine, Ahasan Ahamad, Ahmed Mayet +5
We study the nano- and micro-structures that increase the optical efficiency of the CMOS image pixels in visible and infrared. We consider the difference between the micro-holes at…
Single Micro-hole per Pixel for Thin Ge-on-Si Image Sensor with Enhanced Sensitivity upto 1700 nm
Ekaterina Ponizovskaya-Devine, Ahmed S. Mayet, Amita Rawat +5
We present a Ge-on_Si CMOS image sensor with backside illumination for the near-infrared electromagnetic waves, wavelengths range 300-1700nm, detection essential for optical sensor…
An Accurate Process Induced Variability Aware Compact Model-based Circuit Performance Estimation for Design-Technology Co-optimization
Shubham Patil, Amita Rawat, Udayan Ganguly
In sub-10nm FinFETs, Line-edge-roughness (LER) and metal-gate granularity (MGG) are the two most dominant sources of variability and are mostly modeled semi-empirically. In this wo…