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20222024
most citedSIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation

11 citations · 17 across the 9 of their papers we have counts for

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Showing 2023Show all

6 papers · 1 filter

eess.SP2023★ 3 cited

SenseAI: Real-Time Inpainting for Electron Microscopy

Jack Wells, Amirafshar Moshtaghpour, Daniel Nicholls +4

Despite their proven success and broad applicability to Electron Microscopy (EM) data, joint dictionary-learning and sparse-coding based inpainting algorithms have so far remained…

physics.med-ph2023

The Potential of Subsampling and Inpainting for Fast Low-Dose Cryo FIB-SEM Imaging and Tomography

Daniel Nicholls, Maryna Kobylysnka, Jack Wells +7

Traditional image acquisition for cryo focused ion-beam scanning electron microscopy tomography often sees thousands of images being captured over a period of many hours, with imme…

cond-mat.mtrl-sci2023

Simultaneous High-Speed and Low-Dose 4-D STEM Using Compressive Sensing Techniques

Alex W. Robinson, Amirafshar Moshtaghpour, Jack Wells +5

Here we show that compressive sensing allow 4-dimensional (4-D) STEM data to be obtained and accurately reconstructed with both high-speed and low fluence. The methodology needed t…

eess.SP2023★ 2 cited

Subsampling Methods for Fast Electron Backscattered Diffraction Analysis

Zoë Broad, Daniel Nicholls, Jack Wells +5

Despite advancements in electron backscatter diffraction (EBSD) detector speeds, the acquisition rates of 4-Dimensional (4D) EBSD data, i.e., a collection of 2-dimensional (2D) dif…

physics.comp-ph2023

Scan Coil Dynamics Simulation for Subsampled Scanning Transmission Electron Microscopy

Daniel Nicholls, Jack Wells, Alex W. Robinson +3

Subsampling and fast scanning in the scanning transmission electron microscope is problematic due to scan coil hysteresis - the mismatch between the actual and assumed location of…

cond-mat.mtrl-sci2023

In silico Ptychography of Lithium-ion Cathode Materials from Subsampled 4-D STEM Data

Alex W. Robinson, Amirafshar Moshtaghpour, Jack Wells +5

High quality scanning transmission electron microscopy (STEM) data acquisition and analysis has become increasingly important due to the commercial demand for investigating the pro…