11 citations · 17 across the 9 of their papers we have counts for
9 papers
Compressive Electron Backscatter Diffraction Imaging
Zoë Broad, Alex W. Robinson, Jack Wells +4
Electron backscatter diffraction (EBSD) has developed over the last few decades into a valuable crystallographic characterisation method for a wide range of sample types. Despite t…
SenseAI: Real-Time Inpainting for Electron Microscopy
Jack Wells, Amirafshar Moshtaghpour, Daniel Nicholls +4
Despite their proven success and broad applicability to Electron Microscopy (EM) data, joint dictionary-learning and sparse-coding based inpainting algorithms have so far remained…
The Potential of Subsampling and Inpainting for Fast Low-Dose Cryo FIB-SEM Imaging and Tomography
Daniel Nicholls, Maryna Kobylysnka, Jack Wells +7
Traditional image acquisition for cryo focused ion-beam scanning electron microscopy tomography often sees thousands of images being captured over a period of many hours, with imme…
Simultaneous High-Speed and Low-Dose 4-D STEM Using Compressive Sensing Techniques
Alex W. Robinson, Amirafshar Moshtaghpour, Jack Wells +5
Here we show that compressive sensing allow 4-dimensional (4-D) STEM data to be obtained and accurately reconstructed with both high-speed and low fluence. The methodology needed t…
Subsampling Methods for Fast Electron Backscattered Diffraction Analysis
Zoë Broad, Daniel Nicholls, Jack Wells +5
Despite advancements in electron backscatter diffraction (EBSD) detector speeds, the acquisition rates of 4-Dimensional (4D) EBSD data, i.e., a collection of 2-dimensional (2D) dif…
Scan Coil Dynamics Simulation for Subsampled Scanning Transmission Electron Microscopy
Daniel Nicholls, Jack Wells, Alex W. Robinson +3
Subsampling and fast scanning in the scanning transmission electron microscope is problematic due to scan coil hysteresis - the mismatch between the actual and assumed location of…
In silico Ptychography of Lithium-ion Cathode Materials from Subsampled 4-D STEM Data
Alex W. Robinson, Amirafshar Moshtaghpour, Jack Wells +5
High quality scanning transmission electron microscopy (STEM) data acquisition and analysis has become increasingly important due to the commercial demand for investigating the pro…
A Targeted Sampling Strategy for Compressive Cryo Focused Ion Beam Scanning Electron Microscopy
Daniel Nicholls, Jack Wells, Alex W. Robinson +5
Cryo Focused Ion-Beam Scanning Electron Microscopy (cryo FIB-SEM) enables three-dimensional and nanoscale imaging of biological specimens via a slice and view mechanism. The FIB-SE…
SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation
Alex W. Robinson, Daniel Nicholls, Jack Wells +3
Recently it has been shown that precise dose control and an increase in the overall acquisition speed of atomic resolution scanning transmission electron microscope (STEM) images c…