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eess.IV2024
Compressive Electron Backscatter Diffraction Imaging
Zoë Broad, Alex W. Robinson, Jack Wells +4
Electron backscatter diffraction (EBSD) has developed over the last few decades into a valuable crystallographic characterisation method for a wide range of sample types. Despite t…
cond-mat.mtrl-sci2024★ 1 cited
Diffusion Distribution Model for Damage Mitigation in Scanning Transmission Electron Microscopy
Amirafshar Moshtaghpour, Abner Velazco-Torrejon, Daniel Nicholls +3
Despite the widespread use of Scanning Transmission Electron Microscopy (STEM) for observing the structure of materials at the atomic scale, a detailed understanding of some releva…