11 citations · 18 across the 11 of their papers we have counts for
11 papers
Compressive Electron Backscatter Diffraction Imaging
Zoë Broad, Alex W. Robinson, Jack Wells +4
Electron backscatter diffraction (EBSD) has developed over the last few decades into a valuable crystallographic characterisation method for a wide range of sample types. Despite t…
Diffusion Distribution Model for Damage Mitigation in Scanning Transmission Electron Microscopy
Amirafshar Moshtaghpour, Abner Velazco-Torrejon, Daniel Nicholls +3
Despite the widespread use of Scanning Transmission Electron Microscopy (STEM) for observing the structure of materials at the atomic scale, a detailed understanding of some releva…
SenseAI: Real-Time Inpainting for Electron Microscopy
Jack Wells, Amirafshar Moshtaghpour, Daniel Nicholls +4
Despite their proven success and broad applicability to Electron Microscopy (EM) data, joint dictionary-learning and sparse-coding based inpainting algorithms have so far remained…
The Potential of Subsampling and Inpainting for Fast Low-Dose Cryo FIB-SEM Imaging and Tomography
Daniel Nicholls, Maryna Kobylysnka, Jack Wells +7
Traditional image acquisition for cryo focused ion-beam scanning electron microscopy tomography often sees thousands of images being captured over a period of many hours, with imme…
Simultaneous High-Speed and Low-Dose 4-D STEM Using Compressive Sensing Techniques
Alex W. Robinson, Amirafshar Moshtaghpour, Jack Wells +5
Here we show that compressive sensing allow 4-dimensional (4-D) STEM data to be obtained and accurately reconstructed with both high-speed and low fluence. The methodology needed t…
Subsampling Methods for Fast Electron Backscattered Diffraction Analysis
Zoë Broad, Daniel Nicholls, Jack Wells +5
Despite advancements in electron backscatter diffraction (EBSD) detector speeds, the acquisition rates of 4-Dimensional (4D) EBSD data, i.e., a collection of 2-dimensional (2D) dif…
Scan Coil Dynamics Simulation for Subsampled Scanning Transmission Electron Microscopy
Daniel Nicholls, Jack Wells, Alex W. Robinson +3
Subsampling and fast scanning in the scanning transmission electron microscope is problematic due to scan coil hysteresis - the mismatch between the actual and assumed location of…
In silico Ptychography of Lithium-ion Cathode Materials from Subsampled 4-D STEM Data
Alex W. Robinson, Amirafshar Moshtaghpour, Jack Wells +5
High quality scanning transmission electron microscopy (STEM) data acquisition and analysis has become increasingly important due to the commercial demand for investigating the pro…
A Targeted Sampling Strategy for Compressive Cryo Focused Ion Beam Scanning Electron Microscopy
Daniel Nicholls, Jack Wells, Alex W. Robinson +5
Cryo Focused Ion-Beam Scanning Electron Microscopy (cryo FIB-SEM) enables three-dimensional and nanoscale imaging of biological specimens via a slice and view mechanism. The FIB-SE…
SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation
Alex W. Robinson, Daniel Nicholls, Jack Wells +3
Recently it has been shown that precise dose control and an increase in the overall acquisition speed of atomic resolution scanning transmission electron microscope (STEM) images c…
Compressive Scanning Transmission Electron Microscopy
Daniel Nicholls, Alex Robinson, Jack Wells +4
Scanning Transmission Electron Microscopy (STEM) offers high-resolution images that are used to quantify the nanoscale atomic structure and composition of materials and biological…