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Investigation of the SiO2-SiC interface using low energy muon spin rotation spectroscopy
Piyush Kumar, Maria Inês Mendes Martins, Marianne Etzelmüller Bathen +3
Using positive muons as local probes implanted at low energy enables gathering information about the material of interest with nanometer depth resolution (low energy muon spin rota…
Nanoscale mapping of sub-gap electroluminescence from step-bunched, oxidized 4H-SiC surfaces
Natalia Alyabyeva, Jacques Ding, Mylène Sauty +7
Scanning tunneling luminescence microscopy (STLM) along with scanning tunneling spectroscopy (STS) is applied to a step-bunched, oxidized 4H-SiC surface prepared on the silicon fac…
Defect Profiling of Oxide-Semiconductor Interfaces Using Low-Energy Muons
Maria Inês Mendes Martins, Piyush Kumar, Judith Woerle +3
Muon spin rotation with low-energy muons (LEμSR) is a powerful nuclear method where electrical and magnetic properties of surface-near regions and thin films can be studied on a le…