Quantifying nanoscale charge density features of contact-charged surfaces with an FEM/KPFM-hybrid approach

Felix Pertl, Juan Carlos Sobarzo, Lubuna Shafeek +2

Kelvin probe force microscopy (KPFM) is a powerful tool for studying contact electrification at the nanoscale, but converting KPFM voltage maps to charge density maps is non-trivia…