4 citations · 4 across the 4 of their papers we have counts for
4 papers
A duality between surface charge and work function in scanning Kelvin probe microscopy
Isaac C. D. Lenton, Felix Pertl, Lubuna Shafeek +1
Scanning Kelvin probe microscopy (SKPM) is a powerful technique for macroscopic imaging of the electrostatic potential above a surface. Though most often used to image work-functio…
No time for surface charge: how bulk conductivity hides charge patterns from KPFM in contact-electrified surfaces
Felix Pertl, Isaac C. D. Lenton, Tobias Cramer +1
Kelvin probe force microscopy (KPFM) is a powerful tool for studying contact electrification, using an tiny tip to image voltages caused by transferred charge. It has been used in…
Beyond the blur: using experimentally determined point spread functions to improve scanning Kelvin probe imaging
Isaac C. D. Lenton, Felix Pertl, Lubuna Shafeek +1
Scanning Kelvin probe microscopy (SKPM) is a powerful technique for investigating the electrostatic properties of material surfaces, enabling the imaging of variations in work func…
Quantifying nanoscale charge density features of contact-charged surfaces with an FEM/KPFM-hybrid approach
Felix Pertl, Juan Carlos Sobarzo, Lubuna Shafeek +2
Kelvin probe force microscopy (KPFM) is a powerful tool for studying contact electrification at the nanoscale, but converting KPFM voltage maps to charge density maps is non-trivia…