20 citations · 34 across the 3 of their papers we have counts for
3 papers
A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation
Enrique Dehaerne, Bappaditya Dey, Sandip Halder +1
Innovative Electronic Design Automation (EDA) solutions are important to meet the design requirements for increasingly complex electronic devices. Verilog, a hardware description l…
SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering
MinJin Hwang, Bappaditya Dey, Enrique Dehaerne +2
In this study, we applied the PointRend (Point-based Rendering) method to semiconductor defect segmentation. PointRend is an iterative segmentation algorithm inspired by image rend…
Optimizing YOLOv7 for Semiconductor Defect Detection
Enrique Dehaerne, Bappaditya Dey, Sandip Halder +1
The field of object detection using Deep Learning (DL) is constantly evolving with many new techniques and models being proposed. YOLOv7 is a state-of-the-art object detector based…