most citedProbabilistic Parameter Estimation Using a Gaussian Mixture Density Network: Application to X-ray Reflectivity Data Curve Fitting

8 citations · 8 across the 2 of their papers we have counts for

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cond-mat.mtrl-sci2022

Experimental verification of polar structures in ultrathin BaTiO_{3} layers using resonant x-ray reflectivity

Kook Tae Kim, Yeong Jae Shinb, Sung-Jin Kang +6

Functional devices with ultrathin ferroelectric layers have been attracted as a promising candidate for next-generation memory and logic device applications. Using the ultrathin fe…