most citedProbabilistic Parameter Estimation Using a Gaussian Mixture Density Network: Application to X-ray Reflectivity Data Curve Fitting

8 citations · 8 across the 1 of their papers we have counts for

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1 paper

cond-mat.dis-nn2022★ 8 cited

Probabilistic Parameter Estimation Using a Gaussian Mixture Density Network: Application to X-ray Reflectivity Data Curve Fitting

Kook Tae Kim, Dong Ryeol Lee

X-ray reflectivity (XRR) is widely used for thin-film structure analysis, and XRR data analysis involves minimizing the difference between an XRR curve calculated from model parame…