8 citations · 8 across the 2 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2022
Experimental verification of polar structures in ultrathin BaTiO_{3} layers using resonant x-ray reflectivity
Kook Tae Kim, Yeong Jae Shinb, Sung-Jin Kang +6
Functional devices with ultrathin ferroelectric layers have been attracted as a promising candidate for next-generation memory and logic device applications. Using the ultrathin fe…
cond-mat.dis-nn2022★ 8 cited
Probabilistic Parameter Estimation Using a Gaussian Mixture Density Network: Application to X-ray Reflectivity Data Curve Fitting
Kook Tae Kim, Dong Ryeol Lee
X-ray reflectivity (XRR) is widely used for thin-film structure analysis, and XRR data analysis involves minimizing the difference between an XRR curve calculated from model parame…