6 citations · 17 across the 15 of their papers we have counts for
4 papers · 1 filter
Measurements of dislocations in 4H-SiC with rocking curve imaging
Ahmar Khaliq, Felix Wittwer, Niklas Pyrlik +9
4H Silicon Carbide (4H-SiC) combines many attractive properties such as a high carrier mobility, a wide bandgap, and a high thermal conductivity, making it an ideal candidate for h…
Annular x-ray optics offer superior resolution for radiation sensitive samples
Felix Wittwer, Peter Modregger
High-resolution x-ray microscopy requires a high photon flux to measure the signal from weakly scattering samples. This exposes samples to high radiation doses, potentially damagin…
Parallax in angular sensitive powder diffraction tomography
Peter Modregger, Ahmar Khaliq, Felix Wittwer
While a few methods for the determination of depth-resolved strain distributions each with inherent limitations are available, tomographic reconstruction has been applied to this p…
Texture tomography with high angular resolution utilizing sparsity
Mads Carlsen, Florencia Malamud, Peter Modregger +5
We demonstrate a novel approach to the reconstruction of scanning probe x-ray diffraction tomography data with anisotropic poly crystalline samples. The method involves reconstruct…