6 citations · 17 across the 15 of their papers we have counts for
7 papers · 1 filter
Increased material differentiation through multi-contrast x-ray imaging: a preliminary evaluation of potential applications to the detection of threat materials
A. Astolfo, I. G. Haig, D. Bate +2
Most material discrimination in security inspections is based on dual-energy x-ray imaging, which enables the determination of a material's effective atomic number (Zeff) as well a…
Object Initialization For Ptychographic Scans With Reduced Overlap
Felix Wittwer, Peter Modregger
X-ray ptychography utilizes overlapping illuminations to reconstruct the object's phase and absorption signal with spatial resolutions much smaller than the focus size. Usually, th…
Defect detection in glass fabric reinforced thermoplastics by laboratory-based X-ray scattering
Özgül Öztürk, Rolf Brönnimann, Peter Modregger
Glass fabric reinforced thermoplastic (GFRT) constitutes a class of composite materials that are especially suited for automobile construction due to their combination of low weigh…
Ptychographic reconstruction with wavefront initialization
Felix Wittwer, Peter Modregger
X-ray ptychography is a cutting edge imaging technique providing ultra-high spatial resolutions. In ptychography, phase retrieval, i.e., the recovery of a complex valued signal fro…
Calibration of scanning acoustic microscopy for the differentiation between unstable and stable atherosclerotic plaques by X-ray fluorescence imaging
Peter Modregger, Mallika Khosla, Prerana Chakrabarti +4
Although cardiovascular diseases are the leading cause of death globally, non-invasive and inexpensive diagnostic tools for the identification of associated unstable atheroscleroti…
Accelerated iterative tomographic reconstruction with x-ray edge illumination
Peter Modregger, Tomasz Korzec, Jeff Meganck +3
Compared to standard tomographic reconstruction, iterative approaches offer the possibility to account for extraneous experimental influences, which allows for a suppression of rel…
X-ray diffraction with micrometer spatial resolution for highly absorbing samples
P. Chakrabarti, A. Wildeis, M. Hartmann +10
X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain bounda…