most citedX-ray diffraction with micrometer spatial resolution for highly absorbing samples

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cond-mat.mtrl-sci2024

Measurements of dislocations in 4H-SiC with rocking curve imaging

Ahmar Khaliq, Felix Wittwer, Niklas Pyrlik +9

4H Silicon Carbide (4H-SiC) combines many attractive properties such as a high carrier mobility, a wide bandgap, and a high thermal conductivity, making it an ideal candidate for h…

cond-mat.mtrl-sci2022★ 1 cited

X-ray diffraction with micrometer spatial resolution for highly absorbing samples

P. Chakrabarti, A. Wildeis, M. Hartmann +10

X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain bounda…