activity
20202022
most citedImpact of Interlayer and Ferroelectric Materials on Charge Trapping during Endurance Fatigue of FeFET with TiN/HfxZr1-xO2/interlayer/Si (MFIS) Gate Structure

61 citations · 148 across the 4 of their papers we have counts for

collaborators
Showing 2021 · cond-mat.mtrl-sciShow all

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