activity
20132020
most citedCharacterization of carbon contamination under ion and hot atom bombardment in a tin-plasma extreme ultraviolet light source

236 citations · 344 across the 6 of their papers we have counts for

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5 papers · 1 filter

physics.plasm-ph2020★ 20 cited

Virtual IED sensor for df rf CCP discharges

M. Bogdanova, D. Lopaev, T. Rakhimova +3

Ion-assisted surface processes are the basis of modern plasma processing. Ion energy distribution (IED) control is critical for precise material modification, especially in atomic-…

physics.plasm-ph2016★ 30 cited

Exploring the electron density in plasma induced by EUV radiation: II. Numerical studies in argon and hydrogen

D. I. Astakhov, W. J. Goedheer, C. J. Lee +8

We used numerical modeling to study the evolution of EUV-induced plasmas in argon and hydrogen. The results of simulations were compared to the electron densities measured by micro…

physics.plasm-ph2015★ 1 cited

Numerical and experimental studies of the carbon etching in EUV-induced plasma

D. I. Astakhov, W. J. Goedheer, C. J. Lee +6

We have used a combination of numerical modeling and experiments to study carbon etching in the presence of a hydrogen plasma. We model the evolution of a low density EUV-induced p…

physics.plasm-ph2014★ 10 cited

Plasma probe characteristics in low density hydrogen pulsed plasmas

D. I. Astakhov, W. J. Goedheer, C. J. Lee +6

Probe theories are only applicable in the regime where the probe's perturbation of the plasma can be neglected. However, it is not always possible to know, a priori, that a particu…

physics.plasm-ph2013★ 47 cited

Comparison of H2 and He carbon cleaning mechanisms in extreme ultraviolet induced and surface wave discharge plasmas

A Dolgov, D Lopaev, T Rachimova +6

Cleaning of contamination of optical surfaces by amorphous carbon (a-C) is highly relevant for extreme ultraviolet (EUV) lithography. We have studied the mechanisms for a-C removal…