R. Tokunaga

most citedThickness dependence of electronic and crystal structures in VO

_{2}

ultrathin films: suppression of the collaborative Mott-Peierls transition

25 citations · 36 across the 2 of their papers we have counts for

collaborators

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2 papers · 1 filter

cond-mat.str-el2021★ 11 cited

Electronic structure of SrTi $_{1 - x}$ V $_{x}$ O $_{3}$ films studied by $in situ$ photoemission spectroscopy: Screening for a transparent electrode material

Tatsuhiko Kanda, Daisuke Shiga, Ryu Yukawa +8

This study investigated the electronic structure of SrTi $_{1 - x}$ V $_{x}$ O $_{3}$ (STVO) thin films, which are solid solutions of strongly correlated transparent conductive oxide (TCO) Sr…

cond-mat.str-el2020★ 25 cited

Thickness dependence of electronic and crystal structures in VO $_{2}$ ultrathin films: suppression of the collaborative Mott-Peierls transition

D. Shiga, B. E. Yang, N. Hasegawa +7

Through $in s i t u$ photoemission spectroscopy, we investigated the change in the electronic and crystal structures of dimensionality-controlled VO $_{2}$ films coherently grown on Ti…

Electronic structure of SrTi1−x​Vx​O3​ films studied by in situ photoemission spectroscopy: Screening for a transparent electrode material

Thickness dependence of electronic and crystal structures in VO2​ ultrathin films: suppression of the collaborative Mott-Peierls transition

Electronic structure of SrTi $_{1 - x}$ V $_{x}$ O $_{3}$ films studied by $in situ$ photoemission spectroscopy: Screening for a transparent electrode material

Thickness dependence of electronic and crystal structures in VO $_{2}$ ultrathin films: suppression of the collaborative Mott-Peierls transition