132 citations · 448 across the 17 of their papers we have counts for
17 papers
Updated all-electron Dirac--Fock densities and an element-adaptive parameterisation of scattering factors and potentials for neutral atoms
Ivan Lobato, Zezhong Zhang, Sandra Van Aert +1
Updated reference data and an analytic parameterisation of elastic electron and X-ray scattering are presented for all 118 neutral atoms. The reference electron densities for the m…
Towards atom counting from first moment STEM images: methodology and possibilities
Yansong Hao, Annick De Backer, Scott David Findlay +1
Through a simulation-based study we develop a statistical model-based quantification method for atomic resolution first moment scanning transmission electron microscopy (STEM) imag…
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization
Daen Jannis, Wouter Van den Broek, Zezhong Zhang +2
By working out the Bethe sum rule, a boundary condition that takes the form of a linear equality is derived for the fine structure observed in ionization edges present in electron…
Relativistic EELS scattering cross-sections for microanalysis based on Dirac solutions
Zezhong Zhang, Ivan Lobato, Hamish Brown +5
The rich information of electron energy-loss spectroscopy (EELS) comes from the complex inelastic scattering process whereby fast electrons transfer energy and momentum to atoms, e…
In-situ Plasma Studies using a Direct Current Microplasma in a Scanning Electron Microscope
Lukas Grünewald, Dmitry Chezganov, Robin De Meyer +5
Microplasmas can be used for a wide range of technological applications and to improve our understanding of fundamental physics. Scanning electron microscopy, on the other hand, pr…
Deep convolutional neural networks to restore single-shot electron microscopy images
I. Lobato, T. Friedrich, S. Van Aert
State-of-the-art electron microscopes such as scanning electron microscopes (SEM), scanning transmission electron microscopes (STEM) and transmission electron microscopes (TEM) hav…
Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions
Zezhong Zhang, Ivan Lobato, Annick De Backer +2
Advanced materials often consist of multiple elements which are arranged in a complicated structure. Quantitative scanning transmission electron microscopy is useful to determine t…
Phase Object Reconstruction for 4D-STEM using Deep Learning
Thomas Friedrich, Chu-Ping Yu, Jo Verbeeck +1
In this study we explore the possibility to use deep learning for the reconstruction of phase images from 4D scanning transmission electron microscopy (4D-STEM) data. The process c…
Coupling charge and topological reconstructions at polar oxide interfaces
T. C. van Thiel, W. Brzezicki, C. Autieri +11
In oxide heterostructures, different materials are integrated into a single artificial crystal, resulting in a breaking of inversion-symmetry across the heterointerfaces. A notable…
Phase retrieval from 4-dimensional electron diffraction datasets
Thomas Friedrich, Chu-Ping Yu, Johan Verbeek +2
We present a computational imaging mode for large scale electron microscopy data, which retrieves a complex wave from noisy/sparse intensity recordings using a deep learning approa…
Procedure for 3D atomic resolution reconstructions using atom-counting and a Bayesian genetic algorithm
Annick De Backer, Sandra Van Aert, Peter D. Nellist +1
We introduce a Bayesian genetic algorithm for reconstructing atomic models of nanoparticles from a single projection using Z-contrast imaging. The number of atoms in a projected at…
Thickness dependent properties in oxide heterostructures driven by structurally induced metal-oxygen hybridization variations
Zhaoliang Liao, Nicolas Gauquelin, Robert J. Green +16
Thickness driven electronic phase transitions are broadly observed in different types of functional perovskite heterostructures. However, uncertainty remains whether these effects…
Atomic resolution mapping of phonon excitations in STEM-EELS experiments
R. Egoavil, N. Gauquelin, G. T. Martinez +3
Atomically resolved electron energy-loss spectroscopy experiments are commonplace in modern aberrationcorrected transmission electron microscopes. Energy resolution has also been i…
Mapping electronic reconstruction at the metal/insulator interfaces in \ce{LaVO_3/SrVO_3} heterostructures
Haiyan Tan, Ricardo Egoavil, Armand Béché +8
A \ce{(LaVO_3)_6/(SrVO_3)_3} superlattice is studied with a combination of sub-Å resolved scanning transmission electron microscopy and monochromated electron energy-loss spectrosc…
Optimized fabrication of high quality La0.67Sr0.33MnO3 thin films considering all essential characteristics
H Boschker, M Huijben, A Vailionis +9
In this article, an overview of the fabrication and properties of high quality La0.67Sr0.33MnO3 (LSMO) thin films is given. A high quality LSMO film combines a smooth surface morph…
Defect engineering in oxide heterostructures by enhanced oxygen surface exchange
M. Huijben, G. Koster, M. K. Kruize +15
The synthesis of materials with well-controlled composition and structure improves our understanding of their intrinsic electrical transport properties. Recent developments in atom…
Electronically coupled complementary interfaces between perovskite band insulators
M. Huijben, G. Rijnders, D. H. A. Blank +6
Perovskite oxides exhibit a plethora of exceptional electronic properties, providing the basis for novel concepts of oxide-electronic devices. The interest in these materials is ev…