6 citations · 6 across the 1 of their papers we have counts for
1 paper
Zhan Gao, Matteo Meneghini, Kathia Harrouche +9
Short-term reliability and robustness of 110 nm AlN/GaN HEMTs has been evaluated by means of off-state, semi-on state and on-state step stress tests on devices having different gat…