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most citedPossibilities of the X-ray Diffraction Data Processing Method for Detecting Reflections with Intensity Below the Background Noise Component

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cond-mat.mtrl-sci2025★ 6 cited

Possibilities of the X-ray Diffraction Data Processing Method for Detecting Reflections with Intensity Below the Background Noise Component

S. V. Gabielkov, I. V. Zhyganiuk, A. D. Skorbun +4

The values of the signal-to-noise ratio are determined, at which the method of processing X-ray diffraction data reveals reflections with intensity less than the noise component of…