Possibilities of the X-ray Diffraction Data Processing Method for Detecting Reflections with Intensity Below the Background Noise Component

Abstract

The values of the signal-to-noise ratio are determined, at which the method of processing X-ray diffraction data reveals reflections with intensity less than the noise component of the background. The possibilities of the method are demonstrated on weak reflections of $\hat{I}\pm$-quartz. The method of processing X-ray diffraction data makes it possible to increase the possibilities of X-ray phase analysis in determining the qualitative phase composition of multiphase materials with a small (down to $0.1$ wt. \%) content of several (up to eight) phases.

27 pages, 6 figures. This version is the accepted author manuscript (postprint) and not the final publisher formatted version. The final version was published in Powder Diffraction (Cambridge University Press). This submission complies with the publisher self archiving policy