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cond-mat.mtrl-sci2024
Direct X-Ray Measurements of Strain in Monolayer MoS from Capping Layers and Geometrical Features
Kathryn Neilson, Marc Jaikissoon, Dante Zakhidov +4
Strain induced through fabrication, both by patterning and capping, can be used to change the properties of two-dimensional (2D) materials or other thin films. Here, we explore how…
physics.app-ph2024★ 59 cited
CMOS-compatible Strain Engineering for High-Performance Monolayer Semiconductor Transistors
Marc Jaikissoon, Çağıl Köroğlu, Jerry A. Yang +3
Strain engineering has played a key role in modern silicon electronics, having been introduced as a mobility booster in the 1990s and commercialized in the early 2000s. Achieving s…