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math.AP2022
A gradient flow for the porous medium equations with Dirichlet boundary conditions
Dongkwang Kim, Dowan Koo, Geuntaek Seo
We consider the gradient flow structure of the porous medium equations with non-negative constant Dirichlet boundary conditions. We construct weak solutions to the equations via th…
cs.LG2022★ 1 cited
A novel approach for wafer defect pattern classification based on topological data analysis
Seungchan Ko, Dowan Koo
In semiconductor manufacturing, wafer map defect pattern provides critical information for facility maintenance and yield management, so the classification of defect patterns is on…