1 citations · 1 across the 2 of their papers we have counts for
2 papers
cs.LG2022★ 1 cited
A novel approach for wafer defect pattern classification based on topological data analysis
Seungchan Ko, Dowan Koo
In semiconductor manufacturing, wafer map defect pattern provides critical information for facility maintenance and yield management, so the classification of defect patterns is on…
math.OC2021
One dimensional consensus based algorithm for non-convex optimization
Young-Pil Choi, Dowan Koo
We analyze the consensus based optimization method proposed by Pinnau et al.(2017) in one dimension. We rigorously provide a quantitative error estimate between the consensus point…