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physics.acc-ph2020★ 10 cited
Advances in secondary ion mass spectroscopy
Jonathan Angle, Ari Palczewski, Charles E. Reece +2
Accurate SIMS measurement of nitrogen in niobium relies on the use of closely equivalent standards, made by ion implantation, to convert nitrogen signal intensity to nitrogen conte…
physics.acc-ph2018
Secondary ion mass spectrometry for SRF cavity materials
J. Tuggle, U. Pudasaini, A. S. Palczewski +3
Historically, many advances in superconducting radio frequency (SRF) cavities destined for use in advanced particle accelerators have come empirically, through the iterative proced…