activity
19982022
most citedInteracting polariton fluids in a monolayer of tungsten disulfide

164 citations · 259 across the 6 of their papers we have counts for

collaborators

6 papers

physics.optics2022

Broadband field-enhancement in epsilon-near-zero photonic gap antennas

Félix Thouin, David M. Myers, Ashutosh Patri +3

In recent years, the large electric field enhancement and tight spatial confinement supported by the so-called epsilon-near-zero (ENZ) mode have attracted significant attention for…

physics.ins-det2021★ 28 cited

Exploration of co-sputtered TaO-ZrO thin films for gravitational-wave detectors

M. Abernathy, A. Amato, A. Ananyeva +45

We report on the development and extensive characterization of co-sputtered tantala-zirconia thin films, with the goal to decrease coating Brownian noise in present and future grav…

cond-mat.quant-gas2018★ 164 cited

Interacting polariton fluids in a monolayer of tungsten disulfide

Fábio Barachati, Antonio Fieramosca, Soroush Hafezian +7

Atomically thin transition metal dichalcogenides (TMDs) possess a number of properties that make them attractive for realizing room-temperature polariton devices. An ideal platform…

cond-mat.mtrl-sci2008★ 11 cited

Evidence of valence band perturbations in GaAsN/GaAs(001): A combined variable-angle spectroscopic ellipsometry and modulated photoreflectance investigation

S. Turcotte, S. Larouche, J. -N. Beaudry +4

The contribution of the fundamental gap E_ as well as those of the E_ + Delta(so) and E+ transitions to the dielectric function of GaAs1-xNx alloys near the band edge were determin…

cond-mat.mtrl-sci2001★ 43 cited

Structural properties of silicon dioxide thin films densified by medium-energy particles

Alexis Lefevre, Laurent J. Lewis, Ludvik Martinu +1

Classical molecular-dynamics simulations have been carried out to investigate densification mechanisms in silicon dioxide thin films deposited on an amorphous silica surface, accor…

physics.optics1998★ 13 cited

A simple method for the determination of slowly varying refractive index profiles from in situ spectrophotometric measurements

Daniel Poitras, Ludvik Martinu

Reliable control of the deposition process of optical films and coatings frequently requires monitoring of the refractive index profile throughout the layer. In the present work a…