collaborators

1 paper

cond-mat.mtrl-sci2018

Full field electron spectromicroscopy applied to ferroelectric materials

N. Barrett, J. E. Rault, J. L. Wang +15

The application of PhotoEmission Electron Microscopy (PEEM) and Low Energy Electron Microscopy (LEEM) techniques to the study of the electronic and chemical structure of ferroelect…