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physics.optics2021★ 2 cited
Traceable localization enables accurate integration of quantum emitters and photonic structures with high yield
Craig R. Copeland, Adam L. Pintar, Ronald G. Dixson +6
Traceability to the International System of Units (SI) is fundamental to measurement accuracy and reliability. In this study, we demonstrate subnanometer traceability of localizati…
physics.optics2020★ 14 cited
Accurate localization microscopy by intrinsic aberration calibration
Craig R. Copeland, Craig D. McGray, B. Robert Ilic +2
A standard paradigm of localization microscopy involves extension from two to three dimensions by engineering information into emitter images, and approximation of errors resulting…