72 citations · 139 across the 10 of their papers we have counts for
10 papers
Titanic overconfidence -- dark uncertainty can sink hybrid metrology for semiconductor manufacturing
Ronald G. Dixson, Adam L. Pintar, R. Joseph. Kline +4
Hybrid metrology for semiconductor manufacturing is on a collision course with dark uncertainty. An IEEE technology roadmap for this venture has targeted a linewidth uncertainty of…
Letter to the Editor Concerning "Simultaneous, Single-Particle Measurements of Size and Loading Give Insights into the Structure of Drug-Delivery Nanoparticles"
Andrew C. Madison, Adam L. Pintar, Craig R. Copeland +2
The vexing error of excess variance in the sizing of single particles degrades accuracy in applications ranging from quality control of nanoparticle products to hazard assessment o…
Sub-picoliter Traceability of Microdroplet Gravimetry and Microscopy
Lindsay C. C. Elliott, Adam L. Pintar, Craig R. Copeland +5
Gravimetry typically lacks the resolution to measure single microdroplets, whereas microscopy is often inaccurate beyond the resolution limit. To address these issues, we advance a…
Traceable localization enables accurate integration of quantum emitters and photonic structures with high yield
Craig R. Copeland, Adam L. Pintar, Ronald G. Dixson +6
Traceability to the International System of Units (SI) is fundamental to measurement accuracy and reliability. In this study, we demonstrate subnanometer traceability of localizati…
A lateral nanoflow assay reveals nanoplastic fluorescence heterogeneity
Kuo-Tang Liao, Andrew C. Madison, Adam L. Pintar +3
Plastic nanoparticles present technological opportunities and environmental concerns, but measurement challenges impede product development and hazard assessment. To meet these cha…
Accurate localization microscopy by intrinsic aberration calibration
Craig R. Copeland, Craig D. McGray, B. Robert Ilic +2
A standard paradigm of localization microscopy involves extension from two to three dimensions by engineering information into emitter images, and approximation of errors resulting…
Particle tracking of microelectromechanical system performance and reliability
Craig R. Copeland, Craig D. McGray, Jon Geist +1
Microelectromechanical systems (MEMS) that require contact of moving parts to implement complex functions exhibit limits to their performance and reliability. Here, we advance our…
Subnanometer localization accuracy in widefield optical microscopy
Craig R. Copeland, Jon Geist, Craig D. McGray +4
The common assumption that precision is the limit of accuracy in localization microscopy and the typical absence of comprehensive calibration of optical microscopes lead to a wides…
Bubble Magnetometry of Nanoparticle Heterogeneity and Interaction
A. L. Balk, I. Gilbert, R. Ivkov +2
Bubbles have a rich history as transducers in particle-physics experiments. In a solid-state analogue, we use bubble domains in nanomagnetic films to measure magnetic nanoparticles…
Simultaneous control of the Dzyaloshinskii-Moriya interaction and magnetic anisotropy in nanomagnetic trilayers
Andrew L. Balk, Kyoung-Whan Kim, Daniel T. Pierce +3
Magneto-optical Kerr effect (MOKE) microscopy measurements of magnetic bubble domains demonstrate that Ar+ irradiation around 100 eV can tune the Dzyaloshinskii-Moriya interaction…