4 papers
Determining Electron Beam Lateral Coherence in a Scanning Electron Microscope Using Electron Diffraction
Evelijn Akerboom, Fatemeh Kiani, Giulia Tagliabue +4
We develop and characterize scanning transmission electron microscopy (STEM) capabilities within a scanning electron microscope (SEM) to investigate the effective lateral coherence…
Complementary ADF-STEM: a Flexible Approach to Quantitative 4D-STEM
Bryan D Esser, Joanne Etheridge
Scanning transmission electron microscopy (STEM) has a broad range of applications in materials characterization, including real-space imaging, spectroscopy, and diffraction, at le…
An experimental approach to mapping chemical bonds in nanostructured materials
Philip N. H. Nakashima, Ding Peng, Xiaofen Tan +5
We introduce a number of techniques in quantitative convergent-beam electron diffraction under development by our group and discuss the basis for measuring interatomic electrostati…
A symmetry-derived mechanism for atomic resolution imaging
Matus Krajnak, Joanne Etheridge
We introduce a new image contrast mechanism for scanning transmission electron microscopy (STEM) that derives from the local symmetry within the specimen. For a given position of t…