A symmetry-derived mechanism for atomic resolution imaging

Abstract

We introduce a new image contrast mechanism for scanning transmission electron microscopy (STEM) that derives from the local symmetry within the specimen. For a given position of the electron probe on the specimen, the image intensity is determined by the degree of similarity between the exit electron intensity distribution and a chosen symmetry operation applied to that distribution. The contrast mechanism detects both light and heavy atomic columns and is robust with respect to specimen thickness, electron probe energy and defocus. Atomic columns appear as sharp peaks that can be significantly narrower than for STEM images using conventional disc and annular detectors. This fundamentally different contrast mechanism complements conventional imaging modes and can be acquired simultaneously with them, expanding the power of STEM for materials characterisation.

7 pages, 5 figures

References in corpus (9)

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• Defect contrast with 4D-STEM: Understanding crystalline order with virtual detectors and beam modification
• Atomic resolution imaging of the strength and 3D direction of atomic displacements in functional oxide thin films
• Increasing Spatial Fidelity and SNR of 4D-STEM using Multi-frame Data Fusion
• Objective crystallographic symmetry classifications of a noisy crystal pattern with strong Fedorov type pseudosymmetries and its optimal image-quality enhancement